Publications

Version: 1.1 Approved

LDO-ID 2014-02-27-01

Title Evaluation of FET Performance and Restrictions by Low-Frequency Measurements

Abstract

In this paper a characterization technique for the evaluation of transistor performance and restrictions is presented, which is based on a simple and low-cost measurement system. Experimental examples, carried out on a 0.5 x 1000 μm2 GaN HEMT, are reported. The validity of the proposed approach is demonstrated by comparing the results with the ones obtained by means of commonly adopted measurement setups.

Authors Vadalà Valeria, Raffo Antonio, Colantonio Paolo, Cipriani Cipriani, Giannini Franco, Lanzieri Claudio, Pantellini Alessio, Nalli Andrea, Bosi Gianni, Vannini Giorgio

Type Paper for Seminar/Symposium/Conference

Media INMMIC 2014 - International workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (02-04 April 2014, Leuven, Belgium)

Web site

Anno 2014