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Thermal imager fixed pattern noise prediction using a characterization of the infrared detector
Cooled infrared detectors are typically characterized by well-known electro-optical parameters: Responsivity, Noise Equivalent Temperature Difference, shot noise, 1/f noise, and so on. Particularly important for staring arrays is also the Residual Fixed Pattern Noise that can be obtained after the application of the Non Uniformity Correction algorithm. A direct measure of this parameter is usually hard to define because the Residual Fixed Pattern Noise strongly depends, other than from the detector, from the choice of the Non Uniformity Correction algorithm and from the operative scenario. In this paper, we introduce three measurable parameters, instability, non-linearity and a residual after a polynomial fitting of the detector response curve, and we demonstrate how they are related to the Residual Fixed Pattern Noise after the application of a Non Uniformity Correction (the relationship with three common correction algorithms is discussed). A comparison with experimental data is also presented and discussed.
Mariani Paolo, Zatti Stefano, Giunti Claudio, Sozzi Barbara, Guadagnoli Emanuele, Porta Antonio
Paper for Specialistic Magazine
SPIE - Optical Engineering
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