Corporate Website
Contatti
en
Technology Transfer
Chi siamo
Brevetti
Pubblicazioni
News
Cerca
it
Created with Sketch.
Chiudi menu
English
italiano
Back
en
Chiudi menu
Chi siamo
Brevetti
Pubblicazioni
News
Corporate Website
Contatti
Lista pubblicazioni
Visualizza PUB_LIST
Versione:
1.0
Approvato
it-IT
it-IT
en-US
LDO-ID
2013-07-08-04
Titolo
Correlation between detector level measurements and residual fixed pattern noise for MWIR and LWIR cooled detectors
Abstract
Cooled infrared detectors are typically characterized by well-known electro-optical parameters: Responsivity, Noise Equivalent Temperature Difference, shot noise, 1/f noise, and so on. Particularly important for staring arrays is also the Residual Fixed Pattern Noise that can be obtained after the application of the Non Uniformity Correction algorithm. A direct measure of this parameter is usually hard to define because the Residual Fixed Pattern Noise strongly depends, other than from the detector, from the choice of the Non Uniformity Correction algorithm and from the operative scenario. In this paper, we introduce three measurable parameters, instability, non-linearity and a residual after a polynomial fitting, and we demonstrate how they are related to the Residual Fixed Pattern Noise after the application of a Non Uniformity Correction (the relationship with three common correction algorithms is discussed). A comparison with experimental data is also presented and discussed.
Autori
Mariani Paolo, Zatti Stefano, Giunti Claudio, Sozzi Barbara, Guadagnoli Emanuele, Porta Antonio
Tipologia
Paper for Seminar/Symposium/Conference
Media
OPTRO 2014 - International Symposium on Optronics in Defense and Security (28-30 January 2014, Paris, France)
Sito web
Anno
2013
Annulla
popup-close
Previous
Next
popup-close
popup-close
Close page
Inserisci il testo di ricerca
popup-close
LinkedIn
Twitter
Facebook
This application needs JavaScript to be enabled
2024-10-13T09:59:19Z
cookie_disclaimer:true
page_disclaimer :false